BANGALORE, INDIA: Tektronix Inc. has joined hands with Philips Electronics India Ltd as the technology support partner to host Philips Connectivity Plugfest 01.
Philips Plugfest, spread over three days, focused on connectivity domains including HDMI and HDMI CEC, DLNA/UPnP and Bluetooth. A unique feature of the event was the emphasis on live testing whereby customers could get their products tested live on the spot at the “Tek Experience Zone”.
According to Jelle Rieske, Senior Director, Consumer Lifestyle, Philips Innovation Campus: “This year’s Plugfest attracted companies that are developing products in the connectivity domain. The participants of the Plugfest were also shown the HDMI ATC (Authorized Test Center) that Philips has set up, at Bangalore, with Tektronix. This ATC also certifies products from our competitors which benefits the end customer as it also allows devices to seamlessly work together and deliver the experience they are looking for.”
“Plugfests are good for learning and problem-solving as many of the products tested here are still in the development phase, “said Naresh Narasimhan, Country Marketing Manager, Tektronix India, ‘Being the worldwide leader in high speed serial data test, Tektronix is very pleased to work with Philips to help improve the overall knowledge level of the local design community and to speed the time-to-market of their products.”
The just concluded Plugfest saw 15 companies participating including consumer electronics and semiconductor companies working on high speed serial data technologies. In all, 29 of their products were tested at the Tek Experience Zone.
In addition to being able to see and use the latest Tektronix test solutions for advanced high speed serial technologies, participants were also able to ask questions and receive advice from Tektronix technical experts onsite.
Showing posts with label Tektronix. Show all posts
Showing posts with label Tektronix. Show all posts
Friday, June 26, 2009
Thursday, June 4, 2009
Tektronix delivers test bench for DDR3 memory design debug and validation
BANGALORE, INDIA: Tektronix Inc. has announced the 3rd generation of its proven DDR analysis software (opt. DDRA) for the DPO/DSA70000B Series and DPO7000 Series Oscilloscopes. The Tektronix DDR test solution supports all speeds of DDR, DDR2, DDR3, LP-DDR and GDDR3 and spans both PHY layer and digital domains.
The company also announced improved connectivity with a new set of Nexus Technology Ball Grid Array (BGA) Component Interposers for DDR 3 memory designs. The Tektronix portfolio of Logic Analyzers, Oscilloscopes and Probing Systems form the core of a critical test bench for design and test engineers working with DDR.
The DDR3 standard supports data rates of 800 mega transfers per second (MT/s) to 2133 MT/s with clock frequencies of 400 MHz to 1066 MHz respectively, double the speed of DDR2 technology. DDR3 is ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming, and 3D visualization.
The Tektronix DDR Analysis software (opt. DDRA) for the DPO/DSA70000B Series and DPO7000 Series Oscilloscopes adds critical specification validation measurements that are not available on competing test solutions. The JEDEC specifications for DDR2 and DDR3 (JESD79-3C, JESD79-2E) stipulate that pass/fail limits for measurements such as Setup and Hold should be de-rated based on the measured slew rates of the associated signals.
Option DDRA now not only offers the needed slew rate measurements, but also performs the de-rating calculation and automatically adjusts the pass/fail limits. DDRA, along with a wide array of sophisticated probing solutions, including today’s introduced BGA Interposer from Nexus Technology, represents the most complete solution for validation and debug of DDR designs from a PHY layer perspective.
The new BGA component interposers for oscilloscopes and logic analyzers use an innovative socketed design that offers easy installation on the customer’s board and the ability to easily change the memory component for characterization/margin testing. This eliminates the need to send the board to a rework house thus avoiding down time and reducing development cycles.
The interposer’s design also delivers unparalleled signal fidelity by using embedded 100-Ohm resistors on each signal line very close to the BGA balls. When used with Tektronix P7500 Series Tri-Mode probes and new solder tips specific to the Nexus product or the TLA7000 Series Logic Analyzer, the interposer becomes part of the probing system and delivers accurate signal acquisition up to 1600MT/s data rates and higher.
“With decreasing geometries and ever-increasing data rates, as seen in DDR3 Memory designs, signal access and probing has become a key task for every memory designer,” said Robert Shelsky, president, Nexus Technology. “The new memory component interposers will provide design engineers with the best overall experience in terms of ease of installation and use. The new interposers help speed the analog characterization, digital debug and protocol verification of DDR3 Memory Components enabling engineers to bring their designs to market faster.”
The increase in memory system performance has led to increasing design complexity necessitating superior validation and test tools. With the industry-leading Tektronix DDR test suite of oscilloscopes, logic analyzers, probes and supporting software, engineers now have access to an entirely new portfolio with industry-best capabilities needed to develop next generation products incorporating the latest DDR technology.
The company also announced improved connectivity with a new set of Nexus Technology Ball Grid Array (BGA) Component Interposers for DDR 3 memory designs. The Tektronix portfolio of Logic Analyzers, Oscilloscopes and Probing Systems form the core of a critical test bench for design and test engineers working with DDR.
The DDR3 standard supports data rates of 800 mega transfers per second (MT/s) to 2133 MT/s with clock frequencies of 400 MHz to 1066 MHz respectively, double the speed of DDR2 technology. DDR3 is ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming, and 3D visualization.
The Tektronix DDR Analysis software (opt. DDRA) for the DPO/DSA70000B Series and DPO7000 Series Oscilloscopes adds critical specification validation measurements that are not available on competing test solutions. The JEDEC specifications for DDR2 and DDR3 (JESD79-3C, JESD79-2E) stipulate that pass/fail limits for measurements such as Setup and Hold should be de-rated based on the measured slew rates of the associated signals.
Option DDRA now not only offers the needed slew rate measurements, but also performs the de-rating calculation and automatically adjusts the pass/fail limits. DDRA, along with a wide array of sophisticated probing solutions, including today’s introduced BGA Interposer from Nexus Technology, represents the most complete solution for validation and debug of DDR designs from a PHY layer perspective.
The new BGA component interposers for oscilloscopes and logic analyzers use an innovative socketed design that offers easy installation on the customer’s board and the ability to easily change the memory component for characterization/margin testing. This eliminates the need to send the board to a rework house thus avoiding down time and reducing development cycles.
The interposer’s design also delivers unparalleled signal fidelity by using embedded 100-Ohm resistors on each signal line very close to the BGA balls. When used with Tektronix P7500 Series Tri-Mode probes and new solder tips specific to the Nexus product or the TLA7000 Series Logic Analyzer, the interposer becomes part of the probing system and delivers accurate signal acquisition up to 1600MT/s data rates and higher.
“With decreasing geometries and ever-increasing data rates, as seen in DDR3 Memory designs, signal access and probing has become a key task for every memory designer,” said Robert Shelsky, president, Nexus Technology. “The new memory component interposers will provide design engineers with the best overall experience in terms of ease of installation and use. The new interposers help speed the analog characterization, digital debug and protocol verification of DDR3 Memory Components enabling engineers to bring their designs to market faster.”
The increase in memory system performance has led to increasing design complexity necessitating superior validation and test tools. With the industry-leading Tektronix DDR test suite of oscilloscopes, logic analyzers, probes and supporting software, engineers now have access to an entirely new portfolio with industry-best capabilities needed to develop next generation products incorporating the latest DDR technology.
Thursday, May 28, 2009
Tektronix re-invents swept spectrum analysis
BANGALORE, INDIA: Tektronix Inc., a leading provider of test, measurement and monitoring instrumentation announced significant enhancements for the RSA6000 Series spectrum analyzers.
These latest hardware and software enhancements deliver unprecedented diagnostic capability and faster time-to-solution using industry-leading triggering technology and real-time signal analysis. The RSA6000 Series offer reduced test times with faster measurement speed, and lower systems cost due to their unique combination of measurement capabilities, making them particularly well suited for spectrum management, radar, electronic warfare, and radio communications applications.
Increasing need for combining digital computing and traditional RF technologies has introduced new analysis challenges, including broadband transients, digital signal processing (DSP) errors, and so-called 'runt' pulses. These signals are becoming more complex and time-consuming to troubleshoot using traditional analyzers that are equipped only with narrow filters and slow spectrum update rates.
Elusive transients can cause intermittent failures that are unacceptable in high-reliability applications, and these interferers and hostile signals often overlap in time and frequency with allowed transmissions, so they are difficult to separate.
Featuring advanced time, amplitude, and DPX Density trigger functions combined with swept DPX spectrum display, the RSA6000 Series now enables faster discovery and capture of these intermittent and rapidly changing signals.
“The enhanced RSA6000 Series essentially re-invents the swept spectrum analyzer,” said Bob Hiebert, director of marketing, Spectrum Analyzer Product Line Tektronix. “As the time-domain and frequency-domain worlds intersect, the logical way forward is to use a single instrument and maximize return on investment. Using the RSA6000 Series spectrum analyzer provides real-time advantages and solid swept performance, adding additional characterization capabilities while satisfying the need for a basic spectrum analyzer and a vector signal analyzer."
More robust analysis tools
Improved broad sweep capability in the RSA6000 Series spectrum analyzer allows quick detection of signals of interest. The DPX engine collects 100s of thousands of spectrums per second over a 110 MHz bandwidth. With this new enhancement, you can now sweep the DPX across the full input range of the RSA6000 Series, up to 14 GHz.
In the time a traditional spectrum analyzer has captured one spectrum, the RSA6000 Series has captured orders of magnitude more spectrum. This new level of performance reduces the chance of missing time-interleaved and transient signals during broadband searches.
The innovative DPX Density trigger captures signals that other analyzers cannot even see, reducing time-to-insight by triggering on signals within signals. This is as easy as pointing at the signal on the DPX Spectrum display and invoking the Trigger On This feature. Other trigger enhancements include the new runt trigger and the ability to time-qualify any trigger.
Time and amplitude qualified triggers are unique to the RSA6000 Series, and will reduce troubleshooting time in numerous applications, including radar and spectrum management.
Additional RSA6000 Series enhancements include a 6X performance improvement to the 2nd generation of the powerful industry-exclusive DPX Live RF spectrum display which now captures more than 292,000 spectrums/second.
With this feature, designers can test with confidence and detect very short duration transients (as brief as 10.3 µs), that are missed by conventional spectrum analyzers. This enhancement is particularly important for applications such as software defined radio and radar.
Pricing and availability
The RSA6000 Series with the new software and hardware enhancements is available immediately worldwide. User-installable upgrade packages for existing RSA6000 Series instruments are also available. RSA6000 Series entry-level pricing begins as low as $77,900 MSRP.
These latest hardware and software enhancements deliver unprecedented diagnostic capability and faster time-to-solution using industry-leading triggering technology and real-time signal analysis. The RSA6000 Series offer reduced test times with faster measurement speed, and lower systems cost due to their unique combination of measurement capabilities, making them particularly well suited for spectrum management, radar, electronic warfare, and radio communications applications.
Increasing need for combining digital computing and traditional RF technologies has introduced new analysis challenges, including broadband transients, digital signal processing (DSP) errors, and so-called 'runt' pulses. These signals are becoming more complex and time-consuming to troubleshoot using traditional analyzers that are equipped only with narrow filters and slow spectrum update rates.
Elusive transients can cause intermittent failures that are unacceptable in high-reliability applications, and these interferers and hostile signals often overlap in time and frequency with allowed transmissions, so they are difficult to separate.
Featuring advanced time, amplitude, and DPX Density trigger functions combined with swept DPX spectrum display, the RSA6000 Series now enables faster discovery and capture of these intermittent and rapidly changing signals.
“The enhanced RSA6000 Series essentially re-invents the swept spectrum analyzer,” said Bob Hiebert, director of marketing, Spectrum Analyzer Product Line Tektronix. “As the time-domain and frequency-domain worlds intersect, the logical way forward is to use a single instrument and maximize return on investment. Using the RSA6000 Series spectrum analyzer provides real-time advantages and solid swept performance, adding additional characterization capabilities while satisfying the need for a basic spectrum analyzer and a vector signal analyzer."
More robust analysis tools
Improved broad sweep capability in the RSA6000 Series spectrum analyzer allows quick detection of signals of interest. The DPX engine collects 100s of thousands of spectrums per second over a 110 MHz bandwidth. With this new enhancement, you can now sweep the DPX across the full input range of the RSA6000 Series, up to 14 GHz.
In the time a traditional spectrum analyzer has captured one spectrum, the RSA6000 Series has captured orders of magnitude more spectrum. This new level of performance reduces the chance of missing time-interleaved and transient signals during broadband searches.
The innovative DPX Density trigger captures signals that other analyzers cannot even see, reducing time-to-insight by triggering on signals within signals. This is as easy as pointing at the signal on the DPX Spectrum display and invoking the Trigger On This feature. Other trigger enhancements include the new runt trigger and the ability to time-qualify any trigger.
Time and amplitude qualified triggers are unique to the RSA6000 Series, and will reduce troubleshooting time in numerous applications, including radar and spectrum management.
Additional RSA6000 Series enhancements include a 6X performance improvement to the 2nd generation of the powerful industry-exclusive DPX Live RF spectrum display which now captures more than 292,000 spectrums/second.
With this feature, designers can test with confidence and detect very short duration transients (as brief as 10.3 µs), that are missed by conventional spectrum analyzers. This enhancement is particularly important for applications such as software defined radio and radar.
Pricing and availability
The RSA6000 Series with the new software and hardware enhancements is available immediately worldwide. User-installable upgrade packages for existing RSA6000 Series instruments are also available. RSA6000 Series entry-level pricing begins as low as $77,900 MSRP.
Monday, May 25, 2009
Tektronix's most accurate Superspeed USB test solution
BANGALORE, INDIA: Tektronix Inc. has announced a new comprehensive toolset for characterization, debug and automated compliance test of Superspeed USB (USB 3.0) devices.
The new option USB-TX with the DPO/DSA70000B Oscilloscope provides an automated one-button solution to validate USB 3.0 transmitter devices – enabling engineers a more efficient way to bring their designs to market. The company also introduced a full set of USB 3.0 test fixtures that enable engineers to perform more accurate transmitter, receiver, and cable testing.
Driven by the continuous need for faster data transmissions, the 10x performance improvement over current USB solutions provided by USB 3.0 creates multiple challenges for system and circuit designers. The increased bandwidth brings with it critical signal transmission and signal fidelity challenges that require highly accurate and versatile test solutions.
While other industry offerings provide only normative measurements per the USB-IF electrical test specification, the Tektronix option USB-TX supports all measurements including normative and informative tests -– Spread Spectrum Clocking (SSC), Slew, Voltage Levels and others. This enables customers to have full confidence in their design validation process.
Where other available solutions are limited to standard specific compliance, Tektronix USB-TX provides a comprehensive and complete characterization, debug and compliance toolset. In combination with the only available plug-style test fixture that enables probing as close to the silicon as possible, the Tektronix USB3.0 test solution provides the truest representation of the signal.
"We have been able to preview the new Tektronix test solution for Superspeed USB and we are excited about the increase in productivity that this solution will bring to Fresco Logic's USB 3.0 chip design process," said Bob McVay, chief technical officer of Fresco Logic. "With the AWG7000 for receiver tolerance testing and the ability to quickly move from a transmitter compliance test environment to debugging, the AWG7000 will prove to be a tremendous time saver."
Automation framework for high-speed serial standards
The Option USB-TX is built on TekExpressä framework which has been developed for automated one-button testing of high speed serial data standards. TekExpress modules are based on the test requirements and Methods of Implementation (MOI) specified and published by the standard bodies.
All tests procedures are automated and customers simply need to select the desired tests to obtain a comprehensive report with pass/fail and margin results. In addition to the new USB 3.0 offering, automation modules are also currently available for SATA and DisplayPort.
“TekExpress takes the guess-work out of high speed serial data testing. In today’s environment, customers are working with multiple standards, making it challenging to become an expert in all of them,” said Ian Valentine, general manager Technology Solutions Group, Tektronix. “TekExpress provides the required expertise and allows our customers to focus on bringing their design to market.”
Complete transmitter, receiver and cable test solution
USB will join other high speed serial standards such as 8 Gb/s PCI Express and SATA 6 Gb/s as one of the more demanding technologies, requiring advanced measurement instruments such as the recently introduced industry leading Tektronix DPO/DSA70000B oscilloscope.
The Tektronix real-time oscilloscopes with bandwidths up to 20GHz provide industry best signal fidelity, lowest noise floor and highest number of effective bits (ENOB), enabling greater margin and fidelity for demanding compliance and debug testing.
For receiver testing, the Tektronix AWG7000B Arbitrary Waveform Generators is the only solution that generates all required signal impairments in a single instrument. Cable and channel measurement solutions are available via the DSA8200 Sampling Oscilloscope.
The new option USB-TX with the DPO/DSA70000B Oscilloscope provides an automated one-button solution to validate USB 3.0 transmitter devices – enabling engineers a more efficient way to bring their designs to market. The company also introduced a full set of USB 3.0 test fixtures that enable engineers to perform more accurate transmitter, receiver, and cable testing.Driven by the continuous need for faster data transmissions, the 10x performance improvement over current USB solutions provided by USB 3.0 creates multiple challenges for system and circuit designers. The increased bandwidth brings with it critical signal transmission and signal fidelity challenges that require highly accurate and versatile test solutions.
While other industry offerings provide only normative measurements per the USB-IF electrical test specification, the Tektronix option USB-TX supports all measurements including normative and informative tests -– Spread Spectrum Clocking (SSC), Slew, Voltage Levels and others. This enables customers to have full confidence in their design validation process.
Where other available solutions are limited to standard specific compliance, Tektronix USB-TX provides a comprehensive and complete characterization, debug and compliance toolset. In combination with the only available plug-style test fixture that enables probing as close to the silicon as possible, the Tektronix USB3.0 test solution provides the truest representation of the signal.
"We have been able to preview the new Tektronix test solution for Superspeed USB and we are excited about the increase in productivity that this solution will bring to Fresco Logic's USB 3.0 chip design process," said Bob McVay, chief technical officer of Fresco Logic. "With the AWG7000 for receiver tolerance testing and the ability to quickly move from a transmitter compliance test environment to debugging, the AWG7000 will prove to be a tremendous time saver."
Automation framework for high-speed serial standards
The Option USB-TX is built on TekExpressä framework which has been developed for automated one-button testing of high speed serial data standards. TekExpress modules are based on the test requirements and Methods of Implementation (MOI) specified and published by the standard bodies.
All tests procedures are automated and customers simply need to select the desired tests to obtain a comprehensive report with pass/fail and margin results. In addition to the new USB 3.0 offering, automation modules are also currently available for SATA and DisplayPort.
“TekExpress takes the guess-work out of high speed serial data testing. In today’s environment, customers are working with multiple standards, making it challenging to become an expert in all of them,” said Ian Valentine, general manager Technology Solutions Group, Tektronix. “TekExpress provides the required expertise and allows our customers to focus on bringing their design to market.”
Complete transmitter, receiver and cable test solution
USB will join other high speed serial standards such as 8 Gb/s PCI Express and SATA 6 Gb/s as one of the more demanding technologies, requiring advanced measurement instruments such as the recently introduced industry leading Tektronix DPO/DSA70000B oscilloscope.
The Tektronix real-time oscilloscopes with bandwidths up to 20GHz provide industry best signal fidelity, lowest noise floor and highest number of effective bits (ENOB), enabling greater margin and fidelity for demanding compliance and debug testing.
For receiver testing, the Tektronix AWG7000B Arbitrary Waveform Generators is the only solution that generates all required signal impairments in a single instrument. Cable and channel measurement solutions are available via the DSA8200 Sampling Oscilloscope.
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