Monday, April 16, 2012

JTAG partners with Sanmina-SCI

EINDHOVEN, THE NETHERLANDS: JTAG Technologies, a leading provider of IEEE std. 1149.x boundary-scan test equipment, announced that Sanmina-SCI, a leading manufacturing solutions company making some of the world’s most complex and valuable optical, electronic and mechanical products, will be using JTAG’s Boundary Scan Tools for Prototype Testing at its Haukipudas Oy facility.

Boundary-Scan has increasingly gained in popularity as an effective test technology for today’s electronic systems. Of course, various parts of a system can still be tested effectively with the traditional ICT or Flying Probe test methods. But the result using Boundary Scan is an all-embracing test strategy with a high test coverage for both the digital and analogue sections in a platform for the use in prototype testing , manufacturing test and in-system programming.

Sanmina SCI Plant manager, Eeva-Liisa Kylmänen, said: “We provide excellent local knowledge and detailed product expertise and excellent support to our existing or new customers. The JTAG Technologies’ testing capability enhances e.g. our test services/tools in our NPI (New Product Introduction) function. Together with FPT (Flying Probe Test) and/or AOI (Automatic Optical Inspection) JTAG testing provides good test coverage for Prototype Testing.”

Peter van den Eijnden, MD, JTAG Technologies, comments: “ We are delighted with this extended partnership with Sanmina SCI as we complement each other in support and knowledge for the growing Finnish EMS market. Through this partnership Sanmina SCI can broaden its boundary-scan technology knowledge and service to its current and new customers.”

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