Wednesday, September 17, 2014

TESCAN intros GAIA3 FIB-SEM workstation

WARRENDALE, USA: TESCAN, a leading provider of charged particle technology and FIB-SEM integrated analytical solutions introduced the new GAIA3 FIB-SEM workstation at the IMC 2014 congress in Prague, Czech Republic, September 7-12, 2014.

The introduction of the GAIA3 builds on the success TESCAN has achieved in the world market with the TESCAN LYRA FIB-SEM workstation. The GAIA3 features a newly developed ultra-high resolution SEM column and integrated RAMAN system. The most unique characterization instrument in its class, the GAIA3 will address all FIB-SEM application requirements in biotechnology, nanotechnology and semiconductor.

"The introduction of the GAIA3 continues our tradition in providing unique high performance instrumentation to our customers," said Martin Zadrazil, Chief Operating Officer of TESCAN ORSAY HOLDING. "The GAIA3 will expand the applications and customer segments we can address in our market."

The proven 3rd generation TESCAN design ensures the highest reliability and uptime with uncompromised ease of use for TEM sample preparation, advanced e-beam and ion lithography, and all forms of 3D characterization, including cryo integration. The workstation concept holds true for all multi-user environments, as the GAIA3 will enable novice and advanced users alike to achieve optimum results.

TESCAN will deliver the first GAIA3 FIB-SEM workstation in October 2014.

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